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High Power and High Frequency Testing

Pushing GaN Power to the Limit

At our state-of-the-art Test and Characterization Facility, next-generation GaN power devices are pushed to their limits. High-power testing under demanding real-world conditions reveals critical insights into performance, efficiency, thermal behavior, and reliability, helping accelerate the development of advanced power electronics for tomorrow’s most challenging applications.

Semiprobe PS4L M8 with dark box and 3KV Chuck

Available Now

Keysight B1505A with multiple high-power SMUs

Available Now

MPI TS2000HP with environmental chamber (-30-200C)

Expected October 2026

Keysight B1500A Semiconductor Device Analyzer

Available Now

Keysight PD1500A Dynamic Power Device Tester/Double Pulse Analyzer

Available Now

Expected Early 2027